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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, 45) Second Edition 1998
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Product details
| Management number | 218112967 | Release Date | 2026/05/03 | List Price | $118.52 | Model Number | 218112967 | ||
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| Category | |||||||||
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information. Read more
| ISBN10 | 3540639764 |
|---|---|
| ISBN13 | 978-3540639763 |
| Edition | Second Edition 1998 |
| Language | English |
| Publisher | Springer |
| Dimensions | 6.5 x 1.25 x 9.75 inches |
| Item Weight | 1.95 pounds |
| Print length | 543 pages |
| Part of series | Springer Series in Optical Sciences |
| Publication date | September 17, 1998 |
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